High Resolution Ellipsometric Study of An N-Alkane Film, Dotriacontane, Adsorbed on a Sio2 Surface

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dc.contributor.authorVolkmann, Ulrich
dc.date.accessioned2017-04-12T14:19:11Z
dc.date.available2017-04-12T14:19:11Z
dc.date.issued2002
dc.identifier.issn0021-9606
dc.identifier.urihttps://repositorio.uc.cl/handle/11534/19895
dc.language.isoen
dc.relation.isformatofJournal of Chemical Physics. Vol. 116, no. 5 (2002), p. [2107]-2115
dc.revistaJournal of Chemical Physicses_ES
dc.subject.ddc510
dc.subject.deweyMatemática física y químicaes_ES
dc.subject.otherPelículas delgadases_ES
dc.subject.otherPropiedades ópticases_ES
dc.subject.otherElipsometríaes_ES
dc.subject.otherCompuestos orgánicoses_ES
dc.titleHigh Resolution Ellipsometric Study of An N-Alkane Film, Dotriacontane, Adsorbed on a Sio2 Surfacees_ES
dc.typeartículo
sipa.codpersvinculados100470
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