High Resolution Ellipsometric Study of An N-Alkane Film, Dotriacontane, Adsorbed on a Sio2 Surface

Thumbnail Image
Files
High Resolution Ellipsometric Study of An N-Alkane Film, Dotriacontane, Adsorbed on a Sio2 Surface.pdf(295.8 KB)
Date
2002
Authors
Journal Title
Journal ISSN
Volume Title
Publisher
Abstract
Description
Keywords
Citation
URI
https://repositorio.uc.cl/handle/11534/19895
Collections
Artículos de revistas