Refinements and Analysis of the Optical-Microwave Scintillometry Method Applied to Measurements over a Vineyard in Chile

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dc.catalogadorjrs
dc.contributor.authorFrancisca Aguirre
dc.contributor.authorOscar Hartogensis
dc.contributor.authorFrancisco Meza
dc.contributor.authorSuarez Poch, Francisco
dc.date.accessioned2024-03-04T15:15:05Z
dc.date.available2024-03-04T15:15:05Z
dc.date.issued2022
dc.fechaingreso.objetodigital2024-05-23
dc.fuente.origenORCID
dc.identifier.doi10.3390/w14030474
dc.identifier.urihttp://doi.org/10.3390/w14030474
dc.identifier.urihttps://repositorio.uc.cl/handle/11534/82150
dc.information.autorucEscuela de Ingeniería; Suarez Poch, Francisco; 0000-0002-4394-957X; 15891
dc.language.isoen
dc.nota.accesoContenido completo
dc.rightsacceso abierto
dc.titleRefinements and Analysis of the Optical-Microwave Scintillometry Method Applied to Measurements over a Vineyard in Chile
dc.typeartículo
sipa.codpersvinculados15891
sipa.trazabilidadORCID;2024-01-22
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