Atomic Force Microscopy Measurements of Topography and Friction on Dotriacontane Films Adsorbed on a Sio2 Surface
dc.contributor.author | Trogisch, S. | |
dc.contributor.author | Vogt, Nikolaus | |
dc.date.accessioned | 2017-04-12T14:18:40Z | |
dc.date.available | 2017-04-12T14:18:40Z | |
dc.date.issued | 2005 | |
dc.identifier.issn | 0021-9606 | |
dc.identifier.uri | https://repositorio.uc.cl/handle/11534/19776 | |
dc.language.iso | en | |
dc.nota.acceso | Contenido parcial | |
dc.relation.isformatof | Journal of Chemical Physics. Vol. 123, no. 15 (2005), p. [154703]-154703 | |
dc.revista | Journal of Chemical Physics | es_ES |
dc.rights | acceso restringido | |
dc.subject.ddc | 510 | |
dc.subject.dewey | Matemática física y química | es_ES |
dc.subject.other | Microscopía de fuerza atómica | es_ES |
dc.subject.other | Películas delgadas | es_ES |
dc.subject.other | Física | es_ES |
dc.title | Atomic Force Microscopy Measurements of Topography and Friction on Dotriacontane Films Adsorbed on a Sio2 Surface | es_ES |
dc.type | artículo | |
sipa.codpersvinculados | 100470 |
Files
Original bundle
1 - 1 of 1
Loading...
- Name:
- Atomic Force Microscopy Measurements of Topography and Friction on Dotriacontane Films Adsorbed on a Sio2 Surface.pdf
- Size:
- 28.4 KB
- Format:
- Adobe Portable Document Format
- Description: