Atomic Force Microscopy Measurements of Topography and Friction on Dotriacontane Films Adsorbed on a Sio2 Surface

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Atomic Force Microscopy Measurements of Topography and Friction on Dotriacontane Films Adsorbed on a Sio2 Surface.pdf(28.4 KB)
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2005
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https://repositorio.uc.cl/handle/11534/19776
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