Talbot-Lau x-ray deflectometer: Refraction-based HEDP imaging diagnostic

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dc.contributor.authorValdivia, M. P.
dc.contributor.authorStutman, D.
dc.contributor.authorStoeckl, C.
dc.contributor.authorTheobald, W.
dc.contributor.authorCollins, G. W.
dc.contributor.authorBouffetier, V
dc.contributor.authorVescovi, M.
dc.contributor.authorMileham, C.
dc.contributor.authorBegishev, I. A.
dc.contributor.authorKlein, S. R.
dc.contributor.authorMelean, R.
dc.contributor.authorMuller, S.
dc.contributor.authorZou, J.
dc.contributor.authorVeloso, F.
dc.contributor.authorCasner, A.
dc.contributor.authorBeg, F. N.
dc.contributor.authorRegan, S. P.
dc.date.accessioned2024-01-10T12:36:58Z
dc.date.available2024-01-10T12:36:58Z
dc.date.issued2021
dc.description.abstractC Talbot-Lau x-ray interferometry has been implemented to map electron density gradients in High Energy Density Physics (HEDP) experiments. X-ray backlighter targets have been evaluated for Talbot-Lau X-ray Deflectometry (TXD). Cu foils, wires, and sphere targets have been irradiated by 10-150 J, 8-30 ps laser pulses, while two pulsed-power generators (similar to 350 kA, 350 ns and similar to 200 kA, 150 ns) have driven Cu wire, hybrid, and laser-cut x-pinches. A plasma ablation front generated by the Omega EP laser was imaged for the first time through TXD for densities >10(23) cm(-3). Backlighter optimization in combination with x-ray CCD, image plates, and x-ray film has been assessed in terms of spatial resolution and interferometer contrast for accurate plasma characterization through TXD in pulsed-power and high-intensity laser environments. The results obtained thus far demonstrate the potential of TXD as a powerful diagnostic for HEDP. Published under an exclusive license by AIP Publishing.
dc.description.funderNNSA
dc.description.funderDoE Office of Science (FES)
dc.description.funderFondecyt
dc.description.funderConseil Regional Aquitaine (project INTALAX)
dc.description.funderAgence Nationale de la Recherche
dc.fechaingreso.objetodigital2024-05-06
dc.format.extent5 páginas
dc.fuente.origenWOS
dc.identifier.doi10.1063/5.0043655
dc.identifier.eissn1089-7623
dc.identifier.issn0034-6748
dc.identifier.pubmedidMEDLINE:34243593
dc.identifier.urihttps://doi.org/10.1063/5.0043655
dc.identifier.urihttps://repositorio.uc.cl/handle/11534/76713
dc.identifier.wosidWOS:000692142700001
dc.information.autorucFacultad de Física; Veloso Espinosa, Felipe; S/I; 14943
dc.issue.numero6
dc.language.isoen
dc.nota.accesocontenido parcial
dc.publisherAIP Publishing
dc.revistaREVIEW OF SCIENTIFIC INSTRUMENTS
dc.rightsacceso restringido
dc.subject.ods07 Affordable and Clean Energy
dc.subject.odspa07 Energía asequible y no contaminante
dc.titleTalbot-Lau x-ray deflectometer: Refraction-based HEDP imaging diagnostic
dc.typeartículo
dc.volumen92
sipa.codpersvinculados14943
sipa.indexWOS
sipa.trazabilidadCarga SIPA;09-01-2024
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