Estimation of residual stresses in perovskite films for capacitor applications

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dc.contributor.authorRamos Moore, Esteban
dc.contributor.authorLeibenguth, Peter
dc.contributor.authorSlawik, Sebastián
dc.contributor.authorCoelho, Rodrigo Santiago
dc.contributor.authorHorwat, David
dc.contributor.authorMigot, Sylvie
dc.contributor.authorLechthaler, B.
dc.contributor.authorMücklich, F.
dc.date.accessioned2020-12-10T22:45:30Z
dc.date.available2020-12-10T22:45:30Z
dc.date.issued2018
dc.format.extent5 páginas
dc.fuente.origenConveris
dc.identifier.doi10.1016/j.tsf.2018.01.011
dc.identifier.issn0040-6090
dc.identifier.urihttps://doi.org/10.1016/j.tsf.2018.01.011
dc.identifier.urihttps://repositorio.uc.cl/handle/11534/49805
dc.language.isoen
dc.pagina.final25
dc.pagina.inicio21
dc.revistaThin Solid Filmses_ES
dc.titleEstimation of residual stresses in perovskite films for capacitor applicationses_ES
dc.typeartículo
dc.volumenVol. 648
sipa.codpersvinculados119740
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