Face recognition via adaptive sparse representations of random patches

dc.contributor.authorMery Quiroz, Domingo Arturo
dc.contributor.authorBowyer, Kevin
dc.date.accessioned2022-05-18T14:38:43Z
dc.date.available2022-05-18T14:38:43Z
dc.date.issued2014
dc.description.abstractUnconstrained face recognition is still an open problem, as state-of-the-art algorithms have not yet reached high recognition performance in real-world environments (e.g., crowd scenes at the Boston Marathon). This paper addresses this problem by proposing a new approach called Adaptive Sparse Representation of Random Patches (ASR+). In the learning stage, for each enrolled subject, a number of random patches are extracted from the subject's gallery images in order to construct representative dictionaries. In the testing stage, random test patches of the query image are extracted, and for each test patch a dictionary is built concatenating the `best' representative dictionary of each subject. Using this adapted dictionary, each test patch is classified following the Sparse Representation Classification (SRC) methodology. Finally, the query image is classified by patch voting. Thus, our approach is able to deal with a larger degree of variability in ambient lighting, pose, expression, occlusion, face size and distance from the camera. Experiments were carried out on five widely-used face databases. Results show that ASR+ deals well with unconstrained conditions, outperforming various representative methods in the literature in many complex scenarios.
dc.fuente.origenIEEE
dc.identifier.doi10.1109/WIFS.2014.7084296
dc.identifier.isbn978-1479988822
dc.identifier.issn2157-4774
dc.identifier.urihttps://doi.org/10.1109/WIFS.2014.7084296
dc.identifier.urihttps://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=7084296
dc.identifier.urihttps://repositorio.uc.cl/handle/11534/64148
dc.information.autorucEscuela de ingeniería ; Mery Quiroz, Domingo Arturo ; S/I ; 102382
dc.language.isoen
dc.nota.accesoContenido parcial
dc.publisherIEEE
dc.relation.ispartofIEEE International Workshop on Information Forensics and Security (2014 : Atlanta, GA, Estados Unidos)
dc.rightsacceso restringido
dc.subjectDictionaries
dc.subjectFace
dc.subjectDatabases
dc.subjectFace recognition
dc.subjectLighting
dc.subjectTesting
dc.subjectTraining
dc.titleFace recognition via adaptive sparse representations of random patcheses_ES
dc.typecomunicación de congreso
sipa.codpersvinculados102382
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