An on-line test strategy and analysis for a 1T1R crossbar memory
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Date
2017
Journal Title
Journal ISSN
Volume Title
Publisher
IEEE
Abstract
Memristors are emerging devices known by their nonvolability, compatibility with CMOS processes and high density in circuits density in circuits mostly owing to the crossbar nanoarchitecture. One of their most notable applications is in the memory system field. Despite their promising characteristics and the advancements in this emerging technology, variability and reliability are still principal issues for memristors. For these reasons, exploring techniques that check the integrity of circuits is of primary importance. Therefore, this paper proposes a method to perform an on-line test capable to detect a single failure inside the memory crossbar array.
Description
Keywords
Memristors, Circuit faults, Microprocessors, Computer architecture, Resistance, Transistors, Inverters