X-ray backlighter requirements for refraction-based electron density diagnostics through Talbot-Lau deflectometry

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dc.contributor.authorValdivia, M. P.
dc.contributor.authorVeloso, F.
dc.contributor.authorStutman, D.
dc.contributor.authorStoeckl, C.
dc.contributor.authorMileham, C.
dc.contributor.authorBegishev, I. A.
dc.contributor.authorTheobald, W.
dc.contributor.authorVescovi, M.
dc.contributor.authorUseche Duque, Wilmer Eleazer
dc.contributor.authorRegan, S. P.
dc.contributor.authorAlbertazzi, B.
dc.contributor.authorRigon, G.
dc.contributor.authorMabey, P.
dc.contributor.authorMichel, T.
dc.contributor.authorPikuz, S. A.
dc.contributor.authorKoenig, M.
dc.contributor.authorCasner, A.
dc.date.accessioned2020-01-20T19:46:33Z
dc.date.available2020-01-20T19:46:33Z
dc.date.issued2018
dc.fuente.origenBibliotecas UC
dc.identifier.doi10.1063/1.5039342
dc.identifier.issn0034-6748
dc.identifier.urihttps://doi.org/10.1063/1.5039342
dc.identifier.urihttps://repositorio.uc.cl/handle/11534/28233
dc.issue.numeroNo. 10
dc.language.isoen
dc.revistaReview Of Scientific Instrumentses_ES
dc.rightsacceso restringido
dc.subject.ddc510
dc.subject.deweyMatemática física y químicaes_ES
dc.subject.otherInterferometriaes_ES
dc.subject.otherElectroneses_ES
dc.subject.otherRayos x - Medicioneses_ES
dc.titleX-ray backlighter requirements for refraction-based electron density diagnostics through Talbot-Lau deflectometryes_ES
dc.typeartículo
dc.volumenVol. 89
sipa.codpersvinculados14943
sipa.codpersvinculados1050344
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