High-contrast pixels: a new feature for defect detection in X-ray testing

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dc.contributor.authorMery, D.
dc.date.accessioned2024-01-10T12:39:22Z
dc.date.available2024-01-10T12:39:22Z
dc.date.issued2006
dc.description.abstractThe detection of defects in X-ray testing follows a pattern recognition scheme where feature extraction plays a very significant role. In this paper, we present a new feature based on the number of high-contrast pixels located inside a segmented potential defect related to the size of the potential defect. The developed feature can be easily computed and offers a high separability according to the Fischer linear discriminant. The feature depends on only two parameters that can be automatically determined in a training phase. The developed feature and other reported features are tested in 72 radioscopic images of aluminium wheels. The comparison shows that the separability of the developed feature is at least six times higher than the separability achieved by other features.
dc.format.extent3 páginas
dc.fuente.origenWOS
dc.identifier.doi10.1784/insi.2006.48.12.751
dc.identifier.issn1354-2575
dc.identifier.urihttps://doi.org/10.1784/insi.2006.48.12.751
dc.identifier.urihttps://repositorio.uc.cl/handle/11534/77183
dc.identifier.wosidWOS:000243175100017
dc.information.autorucIngeniería;Mery D;S/I;102382
dc.issue.numero12
dc.language.isoen
dc.nota.accesoSin adjunto
dc.pagina.final753
dc.pagina.inicio751
dc.publisherBRITISH INST NON-DESTRUCTIVE TESTING
dc.revistaINSIGHT
dc.rightsregistro bibliográfico
dc.subjectPATTERN-RECOGNITION
dc.subject.ods11 Sustainable Cities and Communities
dc.subject.odspa11 Ciudades y comunidades sostenibles
dc.titleHigh-contrast pixels: a new feature for defect detection in X-ray testing
dc.typeartículo
dc.volumen48
sipa.codpersvinculados102382
sipa.indexWOS
sipa.indexScopus
sipa.trazabilidadCarga SIPA;09-01-2024
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