Beyond the GUM: variance-based sensitivity analysis in metrology

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dc.contributor.authorLira, I.
dc.date.accessioned2020-07-22T02:40:33Z
dc.date.available2020-07-22T02:40:33Z
dc.date.issued2016
dc.fuente.origenConveris
dc.identifier.doi10.1088/0957-0233/27/7/075006
dc.identifier.issn0957-0233
dc.identifier.issn1361-6501
dc.identifier.urihttps://doi.org/10.1088/0957-0233/27/7/075006
dc.identifier.urihttps://repositorio.uc.cl/handle/11534/33918
dc.issue.numeroNo. 7
dc.language.isoen
dc.pagina.final8
dc.pagina.inicio1
dc.revistaMeasurement Science and Technologyes_ES
dc.subject.ddc500
dc.subject.deweyCienciases_ES
dc.subject.otherMetrologíaes_ES
dc.subject.otherMedicioneses_ES
dc.titleBeyond the GUM: variance-based sensitivity analysis in metrologyes_ES
dc.typeartículo
dc.volumenVol. 27
sipa.codpersvinculados99450
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