Nanometer Spot Allocation for Raman Spectroscopy on Ferroelectrics by Polarization and Piezoresponse Force Microscopy
dc.contributor.author | Tarrach, Guido | |
dc.date.accessioned | 2017-04-12T14:18:30Z | |
dc.date.available | 2017-04-12T14:18:30Z | |
dc.date.issued | 2001 | |
dc.identifier.doi | 10.1063/1.1414292 | |
dc.identifier.issn | 0003-6951 | |
dc.identifier.uri | https://repositorio.uc.cl/handle/11534/19740 | |
dc.identifier.uri | https://doi.org/10.1063/1.1414292 | |
dc.language.iso | en | |
dc.nota.acceso | Contenido parcial | |
dc.relation.isformatof | Applied Physics Letters. Vol. 79, no. 19 (2001), p. [3152]-3154 | |
dc.revista | Applied Physics Letters | es_ES |
dc.rights | acceso restringido | |
dc.subject.ddc | 510 | |
dc.subject.dewey | Matemática física y química | es_ES |
dc.subject.other | Espectroscopía de Raman | es_ES |
dc.subject.other | Dieléctricos | es_ES |
dc.subject.other | Polarización (luz | es_ES |
dc.title | Nanometer Spot Allocation for Raman Spectroscopy on Ferroelectrics by Polarization and Piezoresponse Force Microscopy | es_ES |
dc.type | artículo | |
sipa.codpersvinculados | 100497 |
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