Nanometer Spot Allocation for Raman Spectroscopy on Ferroelectrics by Polarization and Piezoresponse Force Microscopy

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dc.contributor.authorTarrach, Guido
dc.date.accessioned2017-04-12T14:18:30Z
dc.date.available2017-04-12T14:18:30Z
dc.date.issued2001
dc.identifier.doi10.1063/1.1414292
dc.identifier.issn0003-6951
dc.identifier.urihttps://repositorio.uc.cl/handle/11534/19740
dc.identifier.urihttps://doi.org/10.1063/1.1414292
dc.language.isoen
dc.nota.accesoContenido parcial
dc.relation.isformatofApplied Physics Letters. Vol. 79, no. 19 (2001), p. [3152]-3154
dc.revistaApplied Physics Letterses_ES
dc.rightsacceso restringido
dc.subject.ddc510
dc.subject.deweyMatemática física y químicaes_ES
dc.subject.otherEspectroscopía de Ramanes_ES
dc.subject.otherDieléctricoses_ES
dc.subject.otherPolarización (luzes_ES
dc.titleNanometer Spot Allocation for Raman Spectroscopy on Ferroelectrics by Polarization and Piezoresponse Force Microscopyes_ES
dc.typeartículo
sipa.codpersvinculados100497
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