Automatic defect recognition in x-ray testing using computer vision

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2017
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https://doi.org/10.1109/WACV.2017.119
 http://www.scopus.com/inward/record.url?eid=2-s2.0-85020181039&partnerID=MN8TOARS
 https://repositorio.uc.cl/handle/11534/82693
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