Structure and Growth of Dotriacontane Films on Sio2 and Ag(111) Surfaces: Synchrotron X-Ray Scattering and Molecular Dynamics Simulations

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dc.contributor.authorVolkmann, Ulrich
dc.date.accessioned2017-04-12T14:19:11Z
dc.date.available2017-04-12T14:19:11Z
dc.date.issued2004
dc.identifier.issn0031-8965
dc.identifier.urihttps://repositorio.uc.cl/handle/11534/19893
dc.language.isoen
dc.relation.isformatofPhysica Status Solidi A-Applied Research. Vol. 201, no. 10 (2004), p. [2375]-2380
dc.revistaPhysica Status Solidi A-Applied Researches_ES
dc.subject.ddc510
dc.subject.deweyMatemática física y químicaes_ES
dc.subject.otherPeliculas solidasElipsometríaMoléculas - DinámicaDispersión de rayos Xes_ES
dc.titleStructure and Growth of Dotriacontane Films on Sio2 and Ag(111) Surfaces: Synchrotron X-Ray Scattering and Molecular Dynamics Simulationses_ES
dc.typeartículo
sipa.codpersvinculados100470
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