Surface Kinetic and Roughness on Microstructure Formation in Thin Films
dc.contributor.author | Kim S | |
dc.contributor.author | Ramírez Leiva, Ricardo | |
dc.date.accessioned | 2017-04-10T18:36:55Z | |
dc.date.available | 2017-04-10T18:36:55Z | |
dc.date.issued | 1991 | |
dc.identifier.issn | 1098-0121 | |
dc.identifier.uri | https://repositorio.uc.cl/handle/11534/17636 | |
dc.language.iso | en | |
dc.relation.isformatof | Physical Review. Vol. 43, no. 2 (1991), p. [1843]-1846 | |
dc.revista | Physical Review | es_ES |
dc.subject.ddc | 510 | |
dc.subject.dewey | Matemática física y química | es_ES |
dc.subject.other | Dinámica molecular | es_ES |
dc.subject.other | Cinética | es_ES |
dc.subject.other | Películas delgadas | es_ES |
dc.subject.other | Haces de partículas | es_ES |
dc.title | Surface Kinetic and Roughness on Microstructure Formation in Thin Films | es_ES |
dc.type | artículo | |
sipa.codpersvinculados | 98034 |
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