Browsing by Author "Roy, S."

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    A CSP-theoretic Framework of Checking Conformance of Business Processes
    (IEEE, 2012) Roy, S.; Bihary, S.; Corso Laos, José Alfonso
    In this paper, we tackle the problem of conformance checking which verifies if the event logs (observed) match/fit the reference (arbitrary) process. We use concepts from Communicating Sequential Processes (CSP), which facilitates automated analysis using PAT toolkit. By this technique one can identify all the logs which cannot be properly replayed on the process. We illustrate our approach with an example. Finally, we introduce some metrics based on conformance checking. They are related to fitness, closeness, and appropriateness of the event logs vis-a-vis reference process models.
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    An Automated Analysis of Errors for BPM Processes Modeled Using an In-house Infosys Tool
    (IEEE, 2011) Bastías Barraza, Ignacio Alberto; Bihary, S.; Roy, S.
    We chalk out a procedure for automatically analyzing BPM processes modeled using an in-house Infosys requirements modeling tool, called InFlux. By this analysis, we are able to check the processes for syntactical errors as well as errors due lack of soundness. In the first step of the analysis these processes are checked for syntactical errors using simple graph-search techniques. If these processes do not contain any such error, they are subjected to soundness analysis ( i.e., checking for absence of deadlock and lack of synchronization) using two different approaches with the business process verification tool Woflan and the Petri net model checker LoLA. Depending on the existence of a cycle the models are either fed into Woflan or LoLA. We report our experience with the occurrence of errors in InFlux processes.
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    Magnetic vortices in sub-100 nm magnets
    (2009) Roshchin, Igor V.; Li, Chang-Peng; Suhl, Harry; Batlle, X.; Roy, S.; Sinha, Sunil K.; Mejía López, José Félix; Park, Sungkyun; Pynn, Roger; Fitzsimmons, M. R.; Altbir, D.; Romero, A., H.; Dumas, Randy, Kenneth; Liu, Kai; Schuller, Iván, K.