Structure and Growth of Dotriacontane Films on Sio2 and Ag(111) Surfaces: Synchrotron X-Ray Scattering and Molecular Dynamics Simulations

Thumbnail Image
Files
Structure and growth of dotriacontane films on SiO2 and Ag(111) surfaces, synchrotron X‐ray scattering and molecular dynamics simulations.pdf(210.9 KB)
Date
2004
Authors
Journal Title
Journal ISSN
Volume Title
Publisher
Abstract
Description
Keywords
Citation
URI
https://repositorio.uc.cl/handle/11534/19893
Collections
Artículos de revistas